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Chip scanning - large scale SEM micrographs

Automated image processing allows extracting chip layout information from large scale SEM micrographs The reconstruction of chip layout provides essential processing information for chip reverse engineering and copyright analysis.
Raith offers complete turnkey solutions including column, chamber, stage, electronics and software, too. These solutions are based on our RAITH150 and e_LiNE systems.
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High resolution SEM micrograph of 2 mm
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