Raith expresses its gratitude to all Raith system users who make for this award by submitting their results and thus share their work with Raith and their mutual worldwide community of electron beam lithography and FIB nanofabrication users in R&D.
Winners of Raith Micrograph Award 2019
Double-side membrane patterning in a single exposure
Waveguide-integrated superconducting nanowire single-photon detector device
Superconducting quantum interference proximity transistor with multi tunnel junctions