Scientific publications

Nanofabrication using focused ion beams
(This article first appeared in the March 2018 issue of Microscopy & Analysis magazine)

Comparison of technologies for nano device prototyping with a special focus on ion beams: A review
(Please note, this article is published in Applied Physics Reviews Open Access under the CC-BY license)

A Reverse Engineering Approach for Imaging Neuronal Architecture – Large-Area, High-Resolution SEM imaging
(this article was originally published in Microscopy Today, Volume 24, Issue 05, September 2016, pp 28-33. Thanks to Microscopy Today and Cambridge University Press for permission to distribute this article.)

Essential Knowledge Briefing Guide: FIB Nanofabrication
(the EKB was originally published by Wiley, Microscopy and Analysis)