Lunch & Learn @ DPG 2018:
Advanced FIB nanofabrication with highest precision sample stage and multi-species ion beam technology
When introducing the new FIB-SEM VELION at the DPG in Berlin, we offered a Lunch & Learn session during which the capabilities of a laser interferometer controlled sample stage for nanofabrication were presented and new possibilities of various non-Ga ion species were shown.
Watch the videos below to learn about the application strengths of using a focused ion beam for unique, simplified, precise and 3-dimensional patterning processes.
Watch the session in full:
Watch the session in parts:
Part 1: Introduction FIB nanofabrication
Part 2: Benefits for 3D patterning
Part 3: Large area and long-term processing
Part 4: Advantages of Raith's FIB-SEM setup
Let us know how we can help you by filling out the form below or send us an email to email@example.com.
Whitepaper FIB-SEM nanofabrication
Have you read our White Paper on overcoming nanofabrication limitations yet?
Learn how to benefit from resistless FIB nanofabrication and how to get access to a wide range of applications which are beyond the reach of common FIB-SEM and EBL instruments. The White Paper highlights typical applications that can be addressed with VELION, such as 3D nanostructures at once over mm length, FIB hard masking of large area patterns and many more. Explore the enormous potential of Raith’s FIB-SEM and download the White Paper now!