Raith Instrument Technologies

Did you know that Raith Instruments also enable Automated Large Area SEM Image Acquisition, Automated CD SEM Metrology, Linewidth and Placement Measurements as well as Electrical Probing and FIB nanofabriaction?

Find out all about it here

Symposium at Stanford University on direct-write applications - a huge success

Raith and Heidelberg Instruments recently organized a symposium on direct write, optical, ion and electron beam lithography in close collaboration with their joint customer Stanford Nanofabrication Facility (SNF). 

Read all about it here:

New CHIPSCANNER brochure available

Learn everything you need to know about the large-area 3D SEM imaging solution CHIPSCANNER in the updated and extended new CHIPSCANNER Series System Product Brochure or here.

Download it here

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